Mapping analysis is part of the EDS/EDAX technique, used to determine and measure the concentration of elements in a sample and to map their distribution. This method is based on analyzing the characteristic X-rays generated by the interaction of electrons with the sample. These devices are typically integrated as auxiliary components in scanning electron microscopes (SEM) equipped with an energy-dispersive X-ray spectrometer (EDS) or a wavelength-dispersive X-ray spectrometer (WDS).
In Mapping technology, the distribution of elements in the selected area is represented, where each detected element is displayed in a specific color on the image using assigned pixels.
The characteristic X-rays resulting from the interaction of electrons with the sample can be detected in an integrated electron microscope (SEM) equipped with an EDS or WDS spectrometer. The analysis of X-ray signals can be used to map the distribution of elements and estimate their concentrations in the sample. For basic information about this method, refer to the EDS or EDAX analysis page.
In Mapping technology, the element distribution in the selected area is displayed. Each detected element is represented by a specific color in the image using assigned pixels. To better understand this, refer to the image below. For example, in the following figure, the distribution of chromium (Cr) is represented in blue.
1. Elemental Analysis: A wide range of chemical elements can be analyzed, providing comprehensive information about the chemical composition of the sample.
2. Element Distribution: Mapping analysis helps determine the spatial distribution of elements in the sample, aiding in understanding how different elements are present in materials.
3. Multiple Applications: This technique is used in various fields, including materials science, metallurgy, chemistry, and environmental studies, enabling high-precision sample analysis.
The EDAX-EDS technique provides rich information about the chemical composition of a sample, allowing researchers to conduct detailed studies on material properties, analyze chemical reactions, and understand material behavior under specific conditions.
When using Mapping technology, the area to be examined and the dimensions of the scanned region must be defined to obtain an accurate image of the element distribution in the sample.
Distribution Image:
The Mapping results display the distribution of elements in the sample within a specific region. The resulting image is color-coded, where each color represents a specific element.
Identifying Distribution:
The image can be used to identify how elements are distributed within the sample, helping to understand detailed composition and chemical interactions.
Region Analysis:
Specific areas in the image can be analyzed to determine element concentrations, providing insights into local chemical composition.
Interpreting the results requires a deep understanding of the extracted data. By analyzing spectra, element distribution, and concentration variations across mapped regions, researchers can collaborate with experts at the Photon Center for further insights.