Accurate determination of:
Charge carrier type (n-type or p-type)
Carrier concentration (cm⁻³)
Mobility (cm²/V·s)
Resistivity and sheet carrier density
Measurements available at room temperature or variable temperature conditions.
Sample Types We Support:
Thin films on conductive or insulating substrates
Nanostructured materials and nanowires
Bulk semiconductors and single crystals
Composites and polymer-based materials
Gas sensor and photodetector devices
Four-point probe station (manual/automated)
Source Measure Units (SMUs) for I–V/C–V testing
Hall effect system with magnetic field up to 1 Tesla
LCR meters (precision, high-frequency range)
Impedance analyzer with customized test cells
Probe stations with light sources (LED, laser, solar simulators)
Temperature-controlled stages (room temperature to 200 °C or higher on request)
Semiconductor device analysis
Sensor material optimization
Energy storage and conversion devices (batteries, supercapacitors, fuel cells)
Functional oxide and ferroelectric studies
Thin film and coating quality control
Reliability and failure analysis in electronic materials