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X-ray Micro Probe Analyzer (XPMA)

Introduction:

XPMA is an advanced technology used for elemental analysis of samples, ranging from sodium to uranium. This method offers a range of benefits compared to traditional elemental analysis methods, making it an ideal tool for scientific research and industrial applications. Some of its key advantages include:

1.  Non-destructive analysis: One of the most prominent advantages of XPMA is its ability to analyze samples without damaging them, allowing for future studies on the same sample.

2.   No sample coating required: Unlike some other analytical techniques that require coating the sample with special materials, XPMA can be used directly on untreated samples, saving time and effort.

3.  Graphical images and elemental distribution: This technology provides detailed images of elemental distribution within the sample, helping researchers understand the spatial distribution of elements.

4.   Ability to analyze large samples (up to 10 cm in size): XPMA can analyze relatively large samples, enhancing its flexibility for various applications.

5.  Layered sample analysis: XPMA can accurately analyze different layers within a sample, providing valuable information about its internal structure.

Device and Mechanism of Action:

To precisely determine the analysis location, XPMA uses a high-resolution camera. This camera allows researchers to clearly view sample details and identify optimal analysis points, making the analysis range adjustable based on the study’s needs.

X-ray Micro Probe Analysis (XPMA) is an advanced analytical technique that uses X-rays to identify chemical elements in samples. A narrow beam of X-rays, ranging from 10 to 100 microns, is directed at a specific point or part of the sample, enabling precise chemical analysis.

XPMA can identify elements from sodium to uranium and can be performed in either a vacuum or ambient conditions. The device features a high-resolution camera, allowing for clear visualization of the sample and precise location identification.

The X-rays passing through the sample reveal its internal structure, providing valuable information that can be extracted. XPMA also enables the analysis of sample layers, including determining the thickness of layers at nano and micrometer scales. These advanced capabilities have led to widespread use of this technology in fields like engineering, basic sciences, geology, archaeology, medicine, pharmacy, and criminal science.

XPMA Device Specifications:

When producing X-rays, they exit from a very narrow tube and collide with the sample’s atoms. This collision causes electrons to be ejected from various energy levels in the atom. To return to electronic equilibrium, these ejected electrons are replaced by electrons from higher energy levels. As a result of the energy difference between electron levels, X-rays are emitted from the sample. These radiations have specific wavelengths known as fluorescence waves, and these wavelengths vary from one element to another, allowing the identification of the element by measuring the energy of these wavelengths.

The device can scan the sample using the XPMA method, which can be performed on a sample of a specific size, between two points, along a virtual line, or even within a specific volume to analyze the distribution of elements.

Vacuum and Ambient Pressure Conditions:

Vacuum Section: The air inside the chamber is evacuated using a vacuum pump, creating a complete vacuum environment. This condition is suitable for accurate analysis of solid samples, especially light elements.

Atmospheric Pressure Section: Normal atmospheric conditions are applied to the sample, with a vacuum only in the X-ray tube path and the radiation detector. This is ideal for samples sensitive to vacuum systems, such as fragile and biological samples.

The sample chamber in XPMA does not impose restrictions on sample size, a significant advantage compared to other elemental analysis methods like XRF and EDAX. The sample is not destroyed during the analysis, making this technique suitable for valuable samples. Additionally, this method does not require complex preparations, such as gold coating, as in EDAX, since it does not use electrons.

Thus, XPMA represents a powerful and efficient tool in many scientific and industrial fields.

Applications and Benefits:

XPMA has wide applications across many scientific and industrial fields, including:

  • Geology: Studying rock and mineral formations.

  • Metals: Analyzing metallic materials and their properties.

  • Materials Science: Developing new materials and studying their properties.

  • Archaeology: Analyzing ancient artifacts and understanding the composition of materials used.

  • chemistry: Studying elemental and compound reactions.

  • Forensic Science: Analyzing samples in forensic contexts.

  • Electronics: Examining materials used in electronic devices.

  • Medicine: Analyzing biological samples.

  • Biology: Studying the chemical composition of living organisms.

  • Pharmacy: Analyzing drugs and their compositions.

Given its advantages and wide range of applications, XPMA is considered a powerful and vital tool in modern elemental analysis.

Analysis Conditions:

  1. The sample must be in good condition and free of contamination.

  2. It is preferable for the sample to be flat or properly prepared for easier analysis.

  3. In some cases, the sample may need to be dried or its surface treated.

Results Interpretation:

Spectral Analysis: An X-ray spectrum is obtained, showing peaks corresponding to the elements in the sample. Each peak represents a specific element, and the peak height is related to the concentration of the element.

Element Identification: Using reference databases, elements are identified based on the positions of the peaks in the spectrum.

Concentration Estimation: The relative concentration of elements can be calculated from the peak heights, considering parameters like time, energy, and calibration standards.

Element Distribution: Data can be used to map the distribution of elements within the sample, providing information about the spatial composition.

Comparative Analysis: Results can be compared with previous studies or reference standards to understand the sample’s characteristics.

Scientific Interpretation: The results should be analyzed within the context of the research or application, such as understanding geological processes, chemical reactions, or industrial applications.

Notes: The accuracy of results depends on the sample quality, preparation, and device calibration.

It is important for the analyst to be knowledgeable about how to interpret results and handle any variations or deviations that may arise. Valuable another information that can lead to advancements in research and development can be obtained by communicating with experts at the Photon Center.